Further study of the trace representation of Bent sequences families

KE Pin-hui1; ZHANG Jie2; WEN Qiao-yan2

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Further study of the trace representation of Bent sequences families

更新时间：2024-10-14

- Further study of the trace representation of Bent sequences families
- Issue 5, Pages: 118-121(2007)
- 作者机构：
  
  1. 福建师范大学网络安全与密码技术重点实验室
  2. 北京邮电大学理学院
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN911
- Published：2007
- 稿件说明：
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KE Pin-hui1, ZHANG Jie2, WEN Qiao-yan2. Further study of the trace representation of Bent sequences families[J]. 2007, (5): 118-121.
DOI：

KE Pin-hui1, ZHANG Jie2, WEN Qiao-yan2. Further study of the trace representation of Bent sequences families[J]. 2007, (5): 118-121. DOI：

摘要

满足一定条件的线性满射是生成Bent序列簇的重要部分。对此进行了进一步研究

完全刻画了所有的生成Bent序列簇所必需的线性满射

完善了已有的结果。

Abstract

Linear onto mapping satisfying certain conditions plays an important role in the generation of Bent sequences families.Further discussions were made A well-rounded characterization of these mapping were presented

and known results were showed to be a subcase of our general results.

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Trace representation of Bent sequence families

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